The framework for Machine Model ESD testing is defined by a pair of interrelated documents from key international standards bodies.

• EIA/JESD22-A115-A: Published in October 1997 by the Electronic Industries Association (EIA) and JEDEC, this document establishes the core “Test Method A115-A”. It is a revision of the earlier EIA/JESD22-A115 standard.
• IEC/PAS 62180: Published in August 2000 by the International Electrotechnical Commission (IEC), this is a Publicly Available Specification (PAS). A PAS is a technical specification that does not fulfill all the requirements for a full international standard but is made available to the public. This PAS was submitted by JEDEC and is based on the text of EIA/JESD22-A115-A, with the potential for future transformation into a full International Standard.

The stated purpose of this test method is “to establish a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined Machine Model (MM) electrostatic discharge (ESD).” The objective is to provide reliable and repeatable test results, enabling accurate classifications. The use of these standards is voluntary.