This final section provides the objective criteria for interpreting the test results. By comparing the post-test electrical performance of the DUT against the device specifications, a definitive ESD sensitivity classification can be assigned.

7.1 Failure Criteria

A device is defined as a failure if, after exposure to ESD pulses, it no longer meets the device data sheet requirements. This is determined by the parametric and functional testing performed in the post-test evaluation.

If the device data sheet requires testing at multiple temperatures, the post-stress evaluation shall be performed at the lowest specified temperature first.

7.2 ESD Classification Levels

Based on the highest voltage level passed without failure, the device shall be assigned one of the following Machine Model ESD classifications:

• CLASS A: Any part that fails after exposure to an ESD pulse of 200 volts or less.
• CLASS B: Any part that passes after exposure to an ESD pulse of 200 volts, but fails after exposure to an ESD pulse of 400 volts.
• CLASS C: Any part that passes after exposure to an ESD pulse of 400 volts.

The final, assigned classification must be officially recorded in the test report for the device.